Nanoseen offers professional research and laboratory services
Scanning Electron Microscopy (SEM-EDX)
Scanning Electron Microscope additionally equipped with an energy dispersive X-ray spectrometer (EDX). It is a device for studying the surface topography of solids. The advantage is the possibility of working in an adjustable vacuum (range from 1 to 270 Pa), which enables the imaging of weakly conductive and hydrated samples without the need for their preparation (e.g. spraying with a conductor). Detector types: secondary electron (SE), backscattered electron (BSE), cathodoluminescence (CL).
As part of the research, we perform:
Transmission electron microscopy (TEM-EDX)
Transmission Electron Microscope (TEM). As a source of information about the tested sample, it uses the properties of the electron beam, which partially passes through the tested material and partially bends on the diffraction grating. The transmission electron microscope allows for a detailed study of the structure of the preparations, thanks to the possibility of obtaining a magnification of 1,000,000 times and a resolution of approx. 1 nm. Additionally equipped with an energy dispersive X-ray spectrometer - EDX, thanks to which we can examine the elemental composition in selected areas of the sample.
Atomic Force Microscopy (AFM)
Atomic Force Microscope (AFM) - allows to obtain an image of a surface with a resolution of the order of dimensions of a single atom. The set works as an AFM atomic force microscope and an STM scanning tunneling microscope with atomic resolution.
High-resolution scanning electron microscopy (HR-SEM)
Scanning Electron Microscope (SEM) is a hybrid instrument for the observation and characterization of organic and inorganic materials on the nanometric to micrometric scale. As well as for the preparation of lamellas (SEM, GIS) for TEM.
Spin coater is a device for coating flat surfaces with a thin, even layer of polymer, nanocomposite, varnish, paint etc. Most often a small amount of coating material is applied to the center of the substrate. The substrate is then rotated at high speed to distribute the material using the centrifugal force.
Depending on the speed, we are able to achieve the desired coating thickness. The higher the spin speed, the thinner the coating. Its thickness also depends on the viscosity and concentration of the solution and solvent.
Ultrasonic homogenizer / sonicator
Our ultrasonic homogenizer / sonicator is a multifunctional device. It uses ultrasonic cavitation in a liquid. It can be used to break down many types of cells, bacteria, viruses, animal and plant tissues, to emulsify and separate, homogenize, extract, clean, prepare nanomaterials, dispersions. It is widely used, among others in nanotechnology, biology, medicine, chemistry, materials science, pharmacy.
The machine is used for engraving and cutting non-metals, such as acrylic, polymer nanocomposites, nanocomposites and composites with the addition of nanomaterials, wood, leather, paper, mdf, glass, polymer materials, plastics, etc. The machine also allows for cutting and creating nanocomposites and membranes with a specific (given) shape.
It is a spectroscopic technique that measures Raman scattering, i.e. inelastic scattering of photons. Raman, confocal, dispersion spectrometer is equipped with a video camera that allows for the registration of the place of measurement and a motorized table that allows to make Raman maps. Raman spectroscopy allows to obtain a unique spectrum, characteristic for the type of material tested. It is widely used, for example, in chemistry, pharmacy and the medical sector to identify composition and compounds. As well as in materials engineering: polymers, paper, composites, catalysts, carbon nanotubes, graphene.
Infrared (IR) spectroscopy
A type of spectroscopy that uses infrared radiation. Infrared spectroscopy is widely used in both scientific research and industry. It is a very simple, fast and non-destructive technique. This method allows, among others, to identify functional groups present in the tested substance, and to detect impurities.
Parameters and measurement capabilities of the apparatus:
Modes of operation:
Parameters and measurement capabilities of
the Hyperion 1000/2000 IR microscope:
Sample trimmer, Leica EM TXP
The Leica EM TXP device is a system for precise cutting, grinding and polishing of samples for light and electron microscopy. The possibility of precise selection of parameters together with a wide set of tools makes the trimmer suitable for various applications.
Fischione Plasma Cleaner 1020 plasma cleaning device
The Plasma Cleaner allows you to clean samples immediately before they are inserted into the electron microscope. Removes carbon contamination from sample and sample holder, and reduces contamination during imaging and analysis. It can be used for the preparation (cleaning) of samples used in SEM and TEM microscopy, cleans heavily contaminated samples in 2 minutes or less, does not change the elemental composition and structure of the sample, oil-free vacuum system.
Sputtering machine for applying nanometric gold layers with palladium SC7620 and CA7625 carbon
The device is used to apply thin layers of gold with palladium or carbon layers on the surface of non-conductive samples in order to improve the electrical and thermal conductivity of samples tested in SEM, TEM sample carriers and used in the extraction of (S) TEM replicas.